Dual-OC4 for multi-frequency AFM

Extend the functionality of your SPM to multiple frequencies.

While topographical AFM image is usually acquired with the first resonance frequency of the cantilever, much additional information such as electrical and mechanical properties of the material can be acquired simultaneously by taking advantage of multiple frequencies. With the new Nanonis Oscillation Controller it is now easier than ever to extend normal AFM operation to multiple frequencies. Both the OC4-Station and the Nanonis SPM Control System can easily be upgraded to Dual OC4. The modularity of such a system allows the user to operate each OC4 as either a Lock-in amplifier or a Phase Lock Loop (PLL), independently or in a synchronous manner. A wealth of new dynamic AFM modes become available with many new SPM applications to explore.

Application Notes:

• AM-KPFM in UHV conditions
• AM-KPFM in air
  
• New patent on Kelvin probe

The Graphical User Interface integrates a second Oscillation Controller Module leaving the user the freedom to operate either OC4 as a lock-in or a PLL within the same unified interface. The input of each device can be the same, to check first and second flexural mode of the cantilever for instance, or completely independent, to compare two different frequencies. Both lock-ins are synchronized with the same OCXO  (oven control quartz oscillator) making them perfectly phase-coherent.

This year the 1st Multifrequency AFM Conference will be held in Madrid prior to the NC-AFM Conference.