| |
|
|
| |
Client Publications
Here is a non-exhaustive list of publications in peer-review journals from our Clients using the Nanonis control system.
2008
Brian J. Rodriguez et al., Appl.Phys.Lett. 92, 232903: Local probing of relaxation time distributions in ferroelectric polymer nanomesas: Time-resolved piezoresponse force spectroscopy and spectroscopic imaging L. Chen et al., Adv.Mat. 20, 484: C 60 molecular chain on α-sexithiophene nanostripes H.L. Zhang et al., J.Am.Chem.Soc. 130, 2720: Preferential trapping of C 60 in nanomesh voids C. Wei et al., J.Phys.Chem. C 112, 5036: Low-Temperature Scanning Tunneling Microscopy and Near-Edge X-ray Absorption Fine Structure Investigations of Molecular Orientation of Copper(II) Phthalocyanine Thin Films at Organic Heterojunction Interfaces Miyazoe et al., Appl.Phys.Lett. 92, 043124: Controlled focused electron beam-induced etching for the fabrication of sub-beam-size nanoholes Huang et al., Appl.Phys.Lett. 92, 023105 : "Zigzag" C60 chain arrays
2007
Ziegler et al., Nanotechnology 18, 225505: Compensating electrostatic forces by single-scan Kelvin probe force microscopy Friedli et al., Appl. Phys. Lett. 90, 053106: Mass sensor for in situ monitoring of focused ion and electron beam induced processes Chen et al., Appl. Phys. Lett. 91, 114102: Molecular orientation of 3, 4, 9, 10-perylene-tetracarboxylic-dianhydride thin films at organic heterojunction interfaces Wintjes et al., Angew. Chem. Int. Ed. 46, 4089: A Supramolecular Multiposition Rotary Device Gildemeister et al., Rev. Sci. Instrum. 78, 013704: Construction of a dilution refrigerator cooled scanning force microscope Philippe et al., Appl. Phys. Lett. 91, 111919: Yield stress of monocrystalline rhenium nanowires Wahl et al., Chem. Commun., 1349: Rotation–libration in a hierarchic supramolecular rotor–stator system: Arrhenius activation and retardation by local interaction Heindl et al., Phys. Rev. B 75, 073307: Ballistic electron magnetic microscopy on epitaxial spin valves Nomura et al., Appl. Phys. Lett. 90, 033118: Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage Liu et al., Phys. Rev. Lett. 98, 066103: Self-Assembled MnN Superstructure Naitou et al., J. Appl. Phys. 101, 083704: Investigation of local charged defects within high-temperature annealed HfSiON/SiO2 gate stacks by scanning capacitance spectroscopy Suzuki et al., J. Physics: Conference Series 61, 1117–1121: Improvement of the XANAM System and Acquisition of a Peak Signal with a High S/N ratio
2006
Spillmann et al., Advanced Materials 18, 275-279: A Two-Dimensional Porphyrin-Based Porous Network Featuring Communicating Cavities for the templated Ramoino et al., Chem. Phys. Lett. 417, 22: Layer-selective epitaxial self-assembly of porphyrins on ultrathin insulators Liu et al., Appl. Phy. Lett. 88, 133102: Invasive growth of Co on reconstructed O/Cu(001) Kiebele et al., ChemPhysChem 7, 1462: Adsorption and Dynamics of Long-Range Interacting Fullerenes in a Flexible, Two-Dimensional, Nanoporous Porphyrin Network
2005
Naitou et al., Appl. Phys. Lett. 87, 252908: Spatial fluctuation of dielectric properties in Hf-based high-k gate films studied by scanning capacitance microscopy Fahlbusch et al., J. Mat. Process. Tech. 167, 371: Nanomanipulation in a scanning electron microscope von Arx et al., Phys. Chem. Chem. Phys., 2005, 7(2), 273 - 277): Adsorption and surface mobility of cinchonidine on Pt(111) studied by STM. Scientist of ETH Zurich.
2004
Bonifazi et al., Angew. Chem. Int. Ed.: Supramolecular Patterned Surfaces Driven by Cooperative Assembly of C 60 and Porphyrins on Metal Substrates
2003
Kappenberger et al., Phys. Rev. Lett. 91, 267202: Direct imaging and determination of the uncompensated spin density in exchange-biased CoO/(CoPt) multilayers S. Schintke et al., Page 141 of Annual Report of Paul Scherrer Institut: Phase transition of a confined 2D molecular layer reversibly triggered by the tip of a scanning tunneling microscope.
|
|
|
 |

 Nanonis GmbH Technoparkstrasse 1 8005 Zurich Switzerland Tel.: +41-44 445 18 25 Fax: +41-44 445 18 26 Email: info@nanonis.com
|