Application Notes

Dual-OC4 Applications

Exploring Nanoelectromechanic of Ferroelectrics: PFM with Dual-OC4   NEW !! Follow-up on the recent PFM workshop in EPF-Lausanne, Switzerland. by Nanonis Piezoresponse Force Microscopy (PFM) in air with a Veeco MultiMode Microscope and Nanonis controller with Dual-OC4.

Compensating for CPD in nc-AFM: AM-KPFM in UHV with Dual-OC4     NEW !! by Th. Glatzel and E. Meyer, University of Basel, Switzerland Amplitude Modulation Kelvin Probe measurement (AM-KPFM) in UHV conditions with a home-built AFM using two Nanonis OC4 controllers.

Single Pass Kelvin Probe Measurement Technique in Air with Dual-OC4     NEW !! by H.Diesinger, D.Deresmes, and Th. Melin, IEMN, Lille, France Amplitude Modulation Kelvin Probe measurement (AM-KPFM) at ambient conditions with a Veeco MultiMode microscope using two OC4s.

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AFM Applications

Piezoelectric quartz tuning forks for scanning probe microscopy    NEW !! by J. Rychen, Nanonis Theory and application of tuning forks in SPM

Needle Sensor Operation in non-contact AFM Mode by L.Bolotov, AIST, Tsukuba, Japan Non-contact AFM at a resonance frequency of 1MHz with frequency shifts below 500mHz. Omicron LT-STM.

Optimizing PLL Feedback Paramters: Nanonis perfectPLL™ by A. Gildmeister and K. Ensslin, Swiss Federal Institute of Technology (ETH), Zurich, Switzerland Automatically setting up the PI parameters for a PLL - one click with perfectPLL. Home-built tuning fork AFM in a mixing chamber.

Femtogram resolution for in-situ monitoring of focused ion beam induced milling by V. Friedli et al., Swiss Federal Laboratories for Materials Testing and Research, Thun, Switzerland. Using a cantilever as a micro-balance with a frequency resolutions better than 1mHz with a home-built AFM in an SEM.

Integrating External Equipment - User Channels in the Nanonis SPM Control System by Dr. Y. Naitou, National Institute of Advanced Industrials Science (AIST), Tsukuba, Japan Integrating two external lock-in detectors to measure dC/dV and dC/dZ in tuning-fork based JEOL AFM.

Single-Scan Kelvin Probe Technique in Air with a Dual Oscillation Controller by D. Ziegler and Prof. A. Stemmer, ETH Zurich, Switzerland Using two Nanonis Oscillation Controllers the group developed a new method to measure Kelvin Probe data with a Veeco MultiMode.

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STM Applications

Doing Electrochemistry with an SPM tip: EC-SPM by A. Stieg and J. Gimzewski, UCLA, USA Easy adaptability and flexibility of the Nanonis controller for a home-built STM in liquid.

Spin Valves Investigated with BEMM – a Case for Nanonis's Programming Interface by E. Heindl and C. Back, Universität Regensburg, Germany. Complex automation tools written in LabVIEW using the Nanonis Programming Interface with an Omicron UHV-STM.

Supramolecular Rotary Device by N. Wintjes, A. Kiebele, M. Stöhr, H.Spiellman from University of Basel,  T. Jung from PSI Villigen, and D. Bonifazi, F. Cheng and F. Diedrich from ETH Zurich, Switzerland Investigating supramolecular assemblies for technological applications with an Omicron LT-STM.

High Resolution STM in collaboration with Dr. B. Grandidier, IEMN, University of Lille, France Taking a 12 Mega Pixel image with an Omicron STM-1.

Ultra-low current STM at 100fA in collaboration with Dr. B. Grandidier, IEMN, University of Lille, France Measuring at the ultimate limit of STM with an Omicron STM-1.