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AFM Applications


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CEA-Saclay, France: Dr. Jacques Cousty opted for Nanonis to control a new Omicron VT-AFM but with his homebuilt QPlus sensor. He still could re-use his homebuilt high-voltage amplifier and current preamplifiers. |


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Université Catholique de Louvain, Belgium: Dr. Benoit Hackens decided for Nanonis since it provides a seamless integration with his home-built ULT-SPM with tuning fork. The coarse and automatic approach is done by overriding the attocube ANC 150. |


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Yale University, New Haven, USA: Prof. Udo Schwarz combined the Nanonis controller together with a standard Veeco MultiMode microscope. It is used as both a demonstration equipment at the under-graduate level as well as a versatile research tool. |


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Fritz-Haber-Institute of the Max-Planck-Society, Berlin, Germany: Dr. Markus Heyde is using the Nanonis control system in combination with a custom-built low-temperature, UHV STM/AFM for atomic resolution imaging and site-specific spectroscopy. A tuning fork-based sensor provides the flexibility in selecting between these two scanning probe modes. |


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University of Alberta, Canada: Prof. Wolkow replaced the original JEOL controller with Nanonis for his JSPM 4500A microscope with ncAFM atomic resolution capability. |


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Laboratoire de Physique de la Matière Vivante, EPFL, Switzerland: For his home-built cryoAFM, Prof. Giovanni Dietler opted for the Nanonis control system since it could easily interface the piezo motor driver developed at the EPFL as well as re-use his existing Nanosurf PLL. The result is a unified and user-friendly interface with precise control and monitoring of all signals. |


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Osaka University, Japan: Dr. Masami Kageshima opted for Nanonis to control his home-built AFM. The automatic approach is performed by remote-control of the attocube ANC 150. |


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AIST, Tsukuba, Japan: Nanonis Control System for ncAFM with tuning forks in two modified JEOL SPMs for advanced capacitance measurements. |


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Seagate Technologies, Pittsburgh, USA: Prof. Joachim Ahner uses a Magnetic Force Microscope (MFM) developed at the University of Basel with a Nanonis Control System for the investigation of next generation hard disks. |
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 Nanonis GmbH Technoparkstrasse 1 8005 Zurich Switzerland Tel.: +41-44 445 18 25 Fax: +41-44 445 18 26 Email: info@nanonis.com
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