The simulator lets you explore the complete SPM Control System as if it were connected to a real tunneling microscope. A tutorial and online help will guide you step-by-step to your first image and then you can explore the detailed features of the system.
- Run a coarse approach
- Scan on virtual Si-111 surface
- Record dI/dV curves with the internal lock-in detector
- Perform real-time analysis of noise level
