For ultra-sensitive detection of cantilever deflections, fiber interferometry is a powerful technique, though it is not always optimized. Nanonis has introduced an active feedback loopto control the gap between the fiber-end the back surface of the cantilever, ensuring detection of the cantilever motion at the optimum working point of the interferometer signal. This module automates the operation of the interferometer and integrates it into the control system.
Highlights
Performs automatic calibration of cantilever deflection and piezo movement according to the wavelength of the laser.
Adjusts the operating point automatically in order to optimize the sensitivity.
Deflection can be measured either through the interferometer signal (open loop) or by the piezo movement (closed loop)
Upgrade Kit for SPM100
Upgrade your controller to a fully digital system. More information »
9.10.2008 Adaptation Kit for SPECS STMs
The Adaptation Kit for SPECS STMs further extends the list of commercial microscopes that are supported by the Nanonis controller.
